A novel automated measurement and control system based on VXI bus for I & D logic analysis

作者：Zhang, HX^*; Zhu, YS; Wang, Q

来源：17th IEEE Instrumentation and Measurement Technology Conference, 2000-05-01 to 2000-05-04.

• digital logic analyzer
• domain & trigger tracing
• digital data generation
• DSP processor module
• virtual instrument
• system emulation

This paper describes an instrument system which can be easily applied in instrument & data (I & D) simulation and faults detection, especially tracing some minute errors within hardware or software. This novel automated measurement and testing system mainly includes: the control and DSP module, data emulation and generation module and logic analysis module. The set of simulation and testing system is based on latest VXI bus standard and designed as message based and register based C-size modules covering several sophisticated techniques of directly digital synthesis in the secondary interface. After the frame description of test and measurement architectures, this paper details the hardware techniques and software strategies as well as simulation results. Finally the concluding remarks are reported.

• 出版日期2000
• 单位上海交通大学