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摘要
Molybdenum trioxide films have been deposited using thermal atomic layer deposition techniques with bis(tert-butylimido)bis(dimethylamido) molybdenum. Films were deposited at temperatures from 100 to 300 degrees C using ozone as the oxidant for the process. The Mo precursor was evaluated for thermal stability and volatility using thermogravimetric analysis and static vapor pressure measurements. Film properties were evaluated with ellipsometry, x-ray photoelectron spectroscopy, secondary ion mass spectroscopy, and secondary electron microscopy. The growth rate per cycle was determined to extend from 0.3 to 2.4 angstrom/cycle with <4% nonuniformity (1-sigma) with-in-wafer across a 150mm wafer for the investigated temperature range.
- 出版日期2014-1
