Accelerated life test of white OLED based on lognormal distribution

作者：Zhang Jianping^*; Cheng Guoliang; Chen Xiao; Han Yi; Zhou Tingjun; Qiu Yingji

来源：Indian Journal of Pure & Applied Physics, 2014, 52(10): 671-677.

• White organic light emitting diode
• Accelerated life test
• Lognormal distribution
• Least square method

In order to acquire the life information of white organic light-emitting diode (WOLED), an accelerated life test (ALT) model was established with increased working current. The lognormal distribution was applied to describe the life distribution, while the least square method (LSM) was employed to estimate the logarithm mean value and the logarithm standard deviation. Statistics and analysis on constant stress and step stress test data were performed by using the self-developed software. The numerical results show that the WOLED life is consistent with lognormal distribution and the accelerated model meets the inverse power law. The key acceleration parameter, which was calculated accurately, enables a rapid estimation of WOLED life.

• 出版日期2014-10
• 单位上海电力大学