Application of Fresnel diffraction from a phase step to determination of the spectral line profile

作者：Hassani Khosrow^*; Jabbari Ameneh; Tavassoly Mohammad Taghi

来源：Journal of Optics, 2018, 20(9): 095606.

DOI：10.1088/2040-8986/aad82c

• Fresnel diffraction
• phase step
• spectroscopy
• spectral line profile

Determination of the spectral profile of light signals is an effective way to characterize the structure and dynamics of materials, and also light sources. In this work, we introduce a simple, fast, and cost effective line fitting technique, in which Fresnel diffraction from a phase step is used to determine the central wavelength and linewidth of the spectra of light sources. In principle, a single diffraction pattern suffice to determine the line profile. As proof-of-principle examples, two light emitting diode sources have been investigated using phase steps with different heights. Reproducible results are obtained with relative uncertainties in the order of 10(-2) for both the central wavelength and linewidth. Comparison with conventional spectroscopy measurements are also provided.

• 出版日期2018-9