科研之友
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摘要
Currently, considerable attention has been paid to atmospheric particulate matter (PM) investigation due to its importance in human health and global climate change. Surface characterization, single particle analysis and depth profiling of PM is important for a better understanding of its formation processes and predicting its impact on the environment and human being. Secondary ion mass spectrometry (SIMS) is a surface technique with high surface sensitivity, high spatial resolution chemical imaging and unique depth profiling capabilities. Recent research shows that SIMS has great potential in analyzing both surface and bulk chemical information of PM. In this review, we give a brief introduction of SIMS working principle and survey recent applications of SIMS in PM characterization. Particularly, analyses from different types of PM sources by various SIMS techniques were discussed concerning their advantages and limitations. The future development and needs of SIMS in atmospheric aerosol measurement are proposed with a perspective in broader environmental sciences.
