Grain Boundary Traction Signatures: Quantitative Predictors of Dislocation Emission

作者:Li Ruizhi; Chew Huck Beng*
来源:Physical Review Letters, 2016, 117(8): 085502.
DOI:10.1103/PhysRevLett.117.085502

摘要

We introduce the notion of continuum-equivalent traction fields as local quantitative descriptors of the grain boundary interface. These traction-based descriptors are capable of predicting the critical stresses to trigger dislocation emissions from ductile < 110 > symmetrical-tilt nickel grain boundaries. We show that Shockley partials are emitted when the grain boundary tractions, in combination with external tensile loading, generate a resolved shear stress to cause dislocation slip. The relationship between the local grain boundary tractions and the grain boundary energy is established.

  • 出版日期2016-8-15