Scanning electron microscopy with polarization analysis for multilayered chiral spin textures

作者：Lucassen Juriaan^*; Kloodt Twesten Fabian; Froemter Robert; Oepen Hans Peter; Duine Rembert A; Swagten Henk J M; Koopmans Bert; Lavrijsen Reinoud

来源：Applied Physics Letters, 2017, 111(13): 132403.

DOI：10.1063/1.4998535

We show that scanning electron microscopy with polarization analysis (SEMPA) that is sensitive to both in-plane magnetization components can be used to image the out-of-plane magnetized multi-domain state in multilayered chiral spin textures. By depositing a thin layer of Fe on top of the multilayer, we image the underlying out-of-plane domain state through the mapping of its stray fields in the Fe. We also demonstrate that SEMPA can be used to image the domain wall chirality in these systems after milling away the capping layer and imaging the topmost magnetic layer directly. Published by AIP Publishing.

• 出版日期2017-9-25