A novel gamma-ray imaging method for the pulse-shape characterization of position sensitive semiconductor radiation detectors

作者：Domingo Pardo C^*; Goel N; Engert T; Gerl J; Kojouharov I; Schaffner H; Didierjean F; Duchene G; Sigward M H

来源：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , 2011, 643(1): 79-88.

DOI：10.1016/j.nima.2011.04.021

• gamma-detector
• Pulse shape analysis
• Tracking
• Semiconductor

A new technique for the pulse-shape characterization of gamma-ray position sensitive germanium detectors is presented. This method combines the pulse shape comparison scan (PSCS) principle with a gamma-ray imaging technique. The latter is provided by a supplementary, high performance, position sensitive gamma-ray scintillator detector. We describe the basic aspects of the method and we show measurements made for the study of pulse-shapes in a non-segmented planar HPGe detector. A preliminary application of the PSCS is carried out, although a more detailed investigation is being performed with highly segmented position sensitive detectors.

• 出版日期2011-7-1