Annealing Effect on the Microstructure and Optical Characterization of Zn2SiO4 Thin Film Sputtered on Quartz Glass

作者：Peng Kun Cheng^*; Kao Hao Che; Liu Shiu Jen; Tsai Kuei Lan; Lin Jing Chie

来源：Japanese Journal of Applied Physics, 2013, 52(11): UNSP 11NB04.

DOI：10.7567/JJAP.52.11NB04

A thin ZnO film (approximately 500nm in thickness) was deposited on quartz glass by sputtering a ZnO target (purity of 99.995%) using a radio frequency (RF) power source in the magnetron sputter. Annealing of the specimen at elevated temperatures (i.e., 1000, 1100, and 1200 degrees C) was conducted to clarify the effects of annealing on the microstructure and optical characteristics of the film. It was found that silicon ions diffused faster than zinc and oxygen ions in the system containing the oxide film and quartz glass substrate Zn2SiO4 whose thickness depended on the annealing temperature and duration. The surface and cross-sectional morphologies of the as-sputtered film and films annealed at various temperatures were examined by field emission scanning electron microscopy (FE-SEM) and in more detail by high-resolution transmission electron microscopy (HRTEM). Line scans obtained by scanning transmission electron microscopy (STEM) showed that the composition (wt %) of the film annealed at 1200 degrees C was Zn (70%), Si (20%), and O (10%). These findings indicated that ZnO completely transferred into the Zn2SiO4 film to act as a luminescence center in the case of postannealing at 1200 degrees C for 2 h. The amounts of ZnO transferred to Zn2SiO4 were 38.5% at 1000 degrees C and 31.1% at 1100 degrees C for the same duration. The specimens annealed at 1000, 1100, and 1200 degrees C showed no photoluminescence (PL) emission as determined by measurement.

• 出版日期2013-11
• 单位中央民族大学