科研之友
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摘要
An alternating electric force microscopy (A-EFM) technique, which is effective for the imaging of static electric field gradient in an air atmosphere, is proposed by using our developed alternating force microscopy. A-EFM uses a frequency modulation of a mechanically oscillating conductive tip, which is induced by applying off-resonant AC voltage to the tip. The AC voltage generates off-resonant alternating electric force at the tip. A-EFM detects static electric field gradient with the field polarity from a sample without involving surface forces by using a lock-in detection technique. For a Ba0.7Sr0.3TiO3 ferroelectric thin film, A-EFM clearly imaged the static electric field gradient with field polarity and the boundary of electric domain in an air atmosphere.
- 出版日期2012-12-15
