Scanning capacitance microscopy using a relaxation oscillator

作者:Pahlmeyer M*; Hankins A; Tuppan S; Kim W J
来源:American Journal of Physics, 2015, 83(2): 104-109.
DOI:10.1119/1.4899045

摘要

We have performed scanning capacitance microscopy using a relaxation oscillator. Precision calibrations indicate a sensitivity on the order of 0.05 pF. Surface topography of metallic structures, such as machined grooves and coins, can be readily obtained either in the constant-height (non-contact) or tapping (contact) mode. Spatial resolution of less than 50 mu m has been achieved. Our simple, low-cost system can be a valuable platform in the undergraduate laboratory, providing students with experience in microscopic imaging techniques.

  • 出版日期2015-2