摘要

A new fault-tolerant five-input majority gate for quantum-dot cellular automata (QCA) is presented. There has been considerable research on QCA as an emerging computing scheme in the nanoscale regimes. Two main logic elements for implementation with QCA are "Majority gate" and "Inverter". In this paper, we propose a new approach to the design of fault-tolerant five-input majority gate by considering two-dimensional arrays of QCA cells. We analyze fault-tolerance properties of such block five-input majority gate with respect to misalignment, missing, and dislocation cells. In order to verify the functionality of the proposed component some physical proofs are provided. Our results clearly demonstrate the redundant version of the block five-input majority gate is more robust than the standard style for this gate and its usefulness in designing arithmetic circuits.

  • 出版日期2014-1-22

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