A methodology to model spatially distributed uncertainties in thin-walled structures

作者：Gangadhar Machina^*; Zehn Manfred W

来源：Zeitschrift fur Angewandte Mathematik und Mechanik, 2007, 87(5): 360-376.

DOI：10.1002/zamm.200610321

• manufacturing uncertainties
• spatially distributed parameters
• microstructure
• spatial point patterns
• variogram
• material property model

In modem engineering structures, light weight and thin walled composite parts play an important role. The thin walled composite and other structural elements show uncertainties in material properties and in geometry (e.g., wall thickness) among other due to the manufacturing process. These uncertainties are generally spatially distributed in nature, which cannot be reduced by any refined discretization. To obtain information about the distribution of system responses, the uncertainties have to be included in the modelling and calculation. The implementation of these parameters into finite element (FE) models requires a statistical approach. From our research and experience, the variogram method is the tool to model different types of spatially distributed uncertainties. However, the application of the variogram approach is quite common procedure in various fields but it is still widely unknown in mechanical engineering. This paper presents some theoretical background for the application of variogram method to thin walled composite and other structures, as basis for the implementation of the simulated parameters into FE models.

• 出版日期2007-5