Atomic Resolution Imaging of Grain Boundary Defects in Monolayer Chemical Vapor Deposition-Grown Hexagonal Boron Nitride

作者:Gibb Ashley L; Alem Nasim; Chen Jian Hao; Erickson Kristopher J; Ciston Jim; Gautam Abhay; Linck Martin; Zettl Alex*
来源:Journal of the American Chemical Society, 2013, 135(18): 6758-6761.
DOI:10.1021/ja400637n

摘要

Grain boundaries are observed and characterized in chemical vapor deposition-grown sheets of hexagonal boron nitride (h-BN) via ultra-high-resolution transmission electron microscopy at elevated temperature. Five- and seven-fold defects are readily observed along the grain boundary. Dynamics of strained regions and grain boundary defects are resolved. The defect structures and the resulting out-of-plane warping are consistent with recent theoretical model predictions for grain boundaries in h-BN.

  • 出版日期2013-5-8