Dangling bonds in amorphous silicon investigated by multifrequency EPR

作者：Fehr M^*; Schnegg A; Rech B; Lips K; Astakhov O; Finger F; Freysoldt C; Bittl R; Teutloff C

来源：Journal of Non-Crystalline Solids, 2012, 358(17): 2067-2070.

DOI：10.1016/j.jnoncrysol.2011.12.105

• Electron paramagnetic resonance
• Dangling bond
• Hydrogenated amorphous silicon
• g value
• Hyperfine interaction

Paramagnetic coordination defects in undoped hydrogenated amorphous silicon (a-Si:H) are studied using multifrequency pulsed electron-paramagnetic resonance (EPR) spectroscopy at S-, X-, Q- and W-band microwave frequencies (3.6, 9.7, 34, and 94 GHz, respectively). The improved spectral information extractable from a multifrequency fitting procedure allows us to conclude that the g tensor exhibits a rhombic splitting instead of axial symmetry. Our methods allow for precise and accurate determination of the g tensor principal values g(x)=2.0079(2), g(y)=2.0061(2) and g(z)=2.0034(2) and their distribution parameters (g strain).

• 出版日期2012-9-1