Using the Monte Carlo approach to study effects of power measurement uncertainties on six-port reflectometer performance

作者：Yao J J^*; Yeo S P

来源：Measurement Science and Technology, 2010, 21(2): 025103.

DOI：10.1088/0957-0233/21/2/025103

• six-port reflectometer
• microwave reflection-coefficient measurements

Monte Carlo simulations have been employed to evaluate the effects of power-measurement uncertainties on the performance of six-port reflectometers (even when known to operate under less-than-optimum specifications). The numerical results compiled in the present study provide additional insights that are useful for the design of six-port reflectometers. The practical utility of the simulation software has also been demonstrated for a prototype reflectometer (implemented in microstrip form with modified branch-line couplers) which is able to yield measurement accuracies of +/- 0.01 and +/- 2 degrees. for the magnitude and phase, respectively, of a planar component's reflection coefficient from 4.6 GHz to 5.9 GHz.

• 出版日期2010-2