Altitude and Underground Real-Time SER Characterization of CMOS 65 nm SRAM

作者：Autran J L^*; Roche P; Sauze S; Gasiot G; Munteanu D; Loaiza P; Zampaolo M; Borel J

来源：IEEE Transactions on Nuclear Science, 2009, 56(4): 2258-2266.

DOI：10.1109/TNS.2009.2012426

• Accelerated tests
• alpha contamination
• atmospheric neutrons
• neutron-induced SER
• real-time testing
• SER simulation
• single-Event Rate (SER)
• static memory
• terrestrial radiation environment

We report real-time SER characterization of CMOS 65 nm SRAM memories in both altitude and underground environments. Neutron and alpha-particle SERs are compared with data obtained from accelerated tests and values previously measured for CMOS 130 nm technology.

• 出版日期2009-8
• 单位中国地震局