作者:Sachenko A V*; Belyaev A E; Boltovets N S; Konakova R V; Kapitanchuk L M; Sheremet V N; Sveshnikov Yu N; Pilipchuk A S
来源:Semiconductors, 2014, 48(10): 1308-1311.
DOI:10.1134/S106378261410025X
摘要
The temperature dependence of the contact resistivity rho(c)(T) of Au-Ti-Al-Ti-n(+)-GaN ohmic contacts is studied experimentally and substantiated theoretically in the temperature range T = 4.2-300 K.