科研之友
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摘要
(1)The design of complex digital integrated circuit test chain directly determines the circuit testing diagnosis of high and low efficiency, all of the existing optimization methods are based on the shortest test time, this article proposes a test chain optimization method based on the fault detection rate, optimized the test chain from the attention test speed to pay attention to the test results, and make the design of test chain more practical.
- 出版日期2015
- 单位湖北工业大学
