摘要

We report intense terahertz (THz) pulses inducing intervalley scattering and impact ionization mechanisms in doped InAs crystals by THz pump-THz probe measurements. Two competing mechanisms are observed by varying the impurity doping type of the semiconductors and the strength of the THz field. For p-doped InAs, a cascaded carrier generation dominates while for n-doped InAs, both mechanisms have to be considered. Electron fractional occupancy between the Gamma and L valleys is estimated at different field strengths.

  • 出版日期2011-6-13