科研之友
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摘要
This paper describes a simple and direct method to calculate the shell thickness of spherical core shell nanoparticles from X-ray photoelectron spectroscopy data. In contrast to existing methods, it is not iterative and involves a simple forward calculation that is accurate to a typical error of 4%. The method is applicable to any core shell material pair, but the accuracy becomes worse when the kinetic energy of photoelectrons arising from the core and the shell are widely separated. Application of the method to two example systems from the literature is demonstrated: silicon oxide on silicon and carbon on gold. In both cases, accuracy in shell thickness that is significantly better than an atomic diameter is demonstrated. An accurate direct equation to calculate the thickness of overlayers on planar samples is also provided.
- 出版日期2012-8-9
