Aberration-free short focal length x-ray lenses

作者:Alianelli Lucia*; del Rio Manuel Sanchez; Fox Oliver J L; Korwin Mikke Katarzyna
来源:Optics Letters, 2015, 40(23): 5586-5589.
DOI:10.1364/OL.40.005586

摘要

We treat the problem of defining the ideal x-ray refractive lens design for point focusing of low emittance x-ray beams at third- and fourth-generation synchrotron sources. The task is accomplished by using Fermat's principle to define a lens shape that is completely free from geometrical aberrations. Current microfabrication resolution limits are identified, and a design that tolerates the inherent fabrication imperfections is proposed. The refractive lens design delivers nanometer-sized focused x-ray beams and is compatible with current microfabrication techniques.