Measurement of high-energy (10-60 keV) x-ray spectral line widths with eV accuracy

作者:Seely J F*; Glover J L; Hudson L T; Ralchenko Y; Henins Albert; Pereira N; Feldman U; Di Stefano C A; Kuranz C C; Drake R P; Chen Hui; Williams G J; Park J
来源:Review of Scientific Instruments, 2014, 85(11): 11D618.
DOI:10.1063/1.4891726

摘要

A high resolution crystal spectrometer utilizing a crystal in transmission geometry has been developed and experimentally optimized to measure the widths of emission lines in the 10-60 keV energy range with eV accuracy. The spectrometer achieves high spectral resolution by utilizing crystal planes with small lattice spacings (down to 2d = 0.099 nm), a large crystal bending radius and Rowland circle diameter (965 mm), and an image plate detector with high spatial resolution (60 mu m in the case of the Fuji TR image plate). High resolution W L-shell and K-shell laboratory test spectra in the 10-60 keV range and Ho K-shell spectra near 47 keV recorded at the LLNL Titan laser facility are presented. The Ho K-shell spectra are the highest resolution hard x-ray spectra recorded from a solid target irradiated by a high-intensity laser.

  • 出版日期2014-11