科研之友
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摘要
In this paper we present a new test vehicle designed for Resistive Random Access Memories (RRAM) arrays (from single bit to 1Mbits) characterization. The arrays structure, the decoders, and the selectors are explained as well as the electrical setup that drives the array decoders and performs the electrical characterization. Eventually, we discuss some electrical results concerning the switching voltage variability and show the performance of the test vehicle.
