A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment

作者：Guin Ujjwal^*; DiMase Daniel; Tehranipoor Mohammad

来源：Journal of Electronic Testing-Theory and Applications, 2014, 30(1): 25-40.

DOI：10.1007/s10836-013-5428-2

• Counterfeit IC
• Detection methods
• Assessment
• Defect coverage

The increasing threat of counterfeit electronic components has created specialized service of testing, detection, and avoidance of such components. However, various types of counterfeit components - recycled, remarked, overproduced, defective, cloned, forged documentation, and tampered - pose serious threats to supply chain. Over the past few years, standards and programs have been put in place throughout the supply chain that outline testing, documenting, and reporting procedures. However, there is little uniformity in the test results among the various entities. Currently, there are no metrics for evaluating these counterfeit detection methods. In this paper, we have developed a detailed taxonomy of defects present in counterfeit components. Based on this taxonomy, a comprehensive framework has been developed to find an optimum set of detection methods considering test time, test cost, and application risks. We have also performed an assessment of all the detection methods based on the newly introduced metrics - counterfeit defect coverage, under-covered defects, and not-covered defects.

• 出版日期2014-2