A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution

作者：Zastrau U; Roedel C; Nakatsutsumi M; Feigl T; Appel K; Chen B; Doeppner T; Fennel T; Fiedler T; Fletcher L B; Foerster E; Gamboa E; Gericke D O; Goede S; Grote Fortmann C; Hilbert V; Kazak L; Laarmann T; Lee H J; Mabey P; Martinez F; Meiwes Broer K H; Pauer H; Perske M; Przystawik A; Roling S; Skruszewicz S; Shihab M; Tigge**aeumker J; Toleikis S; Wuensche M; Zacharias H; Glenzer S H; Gregori G

来源：Review of Scientific Instruments, 2018, 89(2): 023703.

DOI：10.1063/1.5007950

We present an extreme ultraviolet (EUV) microscope using a Schwarzschild objective which is optimized for single-shot sub-micrometer imaging of laser-plasma targets. The microscope has been designed and constructed for imaging the scattering from an EUV-heated solid-density hydrogen jet. Imaging of a cryogenic hydrogen target was demonstrated using single pulses of the free-electron laser in Hamburg (FLASH) free-electron laser at a wavelength of 13.5 nm. In a single exposure, we observe a hydrogen jet with ice fragments with a spatial resolution in the sub-micrometer range. In situ EUV imaging is expected to enable novel experimental capabilities for warm dense matter studies of micrometer-sized samples in laser-plasma experiments. Published by AIP Publishing.

• 出版日期2018-2