Direct intensity calibration of X-ray grazing-incidence microscopes with home-lab source

作者：Li, Yaran; Xie, Qing; Chen, Zhiqiang; Xin, Qiuqi; Wang, Xin; Mu, Baozhong^*; Wang, Zhanshan; Liu, Shenye; Ding, Yongkun

来源：Review of Scientific Instruments, 2018, 89(1): 013704.

DOI：10.1063/1.5003959

• PHYSICS BASIS
• LASER
• FACILITY
• DIAGNOSTICS
• IGNITION
• FUSION
• OPTICS

Direct intensity calibration of X-ray grazing-incidence microscopes is urgently needed in quantitative studies of X-ray emission from laser plasma sources in inertial confinement fusion. The existing calibration methods for single reflecting mirrors, crystals, gratings, filters, and X-ray detectors are not applicable for such X-ray microscopes due to the specific optical structure and the restrictions of object-image relation. This article presents a reliable and efficient method that can be performed using a divergent X-ray source and an energy dispersive Si-PIN (silicon positive-intrinsic-negative) detector in an ordinary X-ray laboratory. The transmission theory of X-ray flux in imaging diagnostics is introduced, and the quantities to be measured are defined. The calibration method is verified by a W/Si multilayer-coated Kirkpatrick-Baez microscope with a field of viewof similar to 95 mu m at 17.48 keV. The mirror reflectance curve in the 1D coordinate is drawn with a peak value of 20.9% and an uncertainty of similar to 6.0%. Published by AIP Publishing.

• 出版日期2018-1
• 单位同济大学; 中国工程物理研究院激光聚变研究中心; 北京应用物理与计算数学研究所; 中国工程物理研究院