科研之友
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摘要
Understanding the growth of organic semiconducting molecules with shape anisotropy is of high relevance to the processing of optoelectronic devices. This work provides insight into the growth of thin films of the prototypical rodlike organic semiconductor diindenoperylene on a microscopic level by analyzing in detail the film morphology. We model our data, which were obtained by high-resolution grazing incidence small-angle x-ray scattering, using a theoretical description from small-angle scattering theory derived for simple liquids. Based on form-factor calculations for different object types, we determine how the island shapes change in the respective layers. Atomic force microscopy measurements approve our findings.
- 出版日期2014-11-5
