Non-destructive depth profile reconstruction of bio-engineered surfaces by parallel-angle-resolved X-ray photoelectron spectroscopy

作者：Pilolli Rosa; Ditaranto Nicoletta^*; Cioffi Nicola; Sabbatini Luigia

来源：Analytical and Bioanalytical Chemistry, 2013, 405(2-3): 713-724.

DOI：10.1007/s00216-012-6179-0

• Parallel-angle-resolved XPS
• Concentration depth profile
• Overlayer thickness
• Protein covalent immobilisation

In the present, contribution angle-resolved X-ray photoelectron spectroscopy (AR-XPS) was proposed as a useful tool to address the challenge of probing the near-surface region of bio-active sensor surfaces. A model bio-functionalised surface was characterised by parallel AR-XPS and commercially available Thermo Avantage-ARProcess software was used to generate non-destructive concentration depth profiles of protein-functionalised silicon oxide substrates. At each step of the functionalisation procedure, the surface composition, the overlayer thickness, the in-depth organisation and the in-plane homogeneity were evaluated. The critical discussion of the generated profiles highlighted the relevance of the information provided by PAR-XPS technique.

• 出版日期2013-1