Double diffraction and double reflection in NURBS-UTD method

作者：Wang, Nan^*; Du, XinXin; Wang, Yong; Liang, ChangHong

来源：Microwave and Optical Technology Letters, 2013, 55(7): 1549-1553.

DOI：10.1002/mop.27652

• NURBS
• UTD
• double diffraction
• double reflection
• electrically large problems

Double diffraction and double reflection in NURBS-UTD method are studied in this article. Algorithms being used to trace double reflected rays and double edge diffracted rays are presented. The ray fields carried by these kinds of rays are investigated to discuss the contribution of the double effected ray fields to the total ray fields. Numerical measures are used throughout the whole process and the ray fields are calculated based on single effected ray fields. Two examples are presented and it can be seen from data achieved that double effected ray fields can improve the computational precision according to the relationship between surfaces. Numerical results show the validation and the improvement.

• 出版日期2013-7
• 单位西安电子科技大学