摘要

We present a new noise shaping method and a dual-polarity calibration technique suited for successive approximation register type analog to digital converters (SAR-ADC). Noise is pushed to higher frequencies with the noise shaping by adding a switched capacitor. The SAR capacitor array mismatch has been compensated by the dual-polarity digital calibration with minimum circuit overhead. A proof-of-concept prototype SAR-ADC using the proposed techniques has been fabricated in a 0.5-mu m standard CMOS technology. It achieves 67.7 dB SNDR at 62.5 kHz sampling frequency, while consuming 38.3 mu W power with 1.8 V supply.

  • 出版日期2013-6