Depth profiles of D and T in Metal-hydride films up to large depth

作者：Zhang, HongLiang; Ding, Wei; Su, Ranran; Zhang, Yang; Shi, Liqun^*

来源：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms , 2016, 371: 174-177.

DOI：10.1016/j.nimb.2015.11.030

• Depth profiling
• Nuclear reaction
• Proton backscattering
• Deuterium and tritium

In this paper, a method combining D(He-3, p) He-4 nuclear reaction and proton backscattering (PBS) was adopted to detect the depth profile of both D and T in TiDxTy/Mo film with thickness more than 5 mu m. Different energies of He-3 and proton beam, varied from 1.0 to 3.0 MeV and 1.5 to 3.8 MeV respectively, were used in order to achieve better depth resolution. With carefully varying incident energies, an optimum resolution of less than 0.5 mu m for D and T distribution throughout the whole analyzed range could be achieved.

• 出版日期2016-3-15
• 单位中国工程物理研究院; 复旦大学; 中国工程物理研究院核物理与化学研究所