Application of Si-strip technology to X-ray diffraction instrumentation

作者：Gerndt E^*; Dabrowski W; Brugemann L; Fink J; Swientek K; Wiacek P

来源：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , 2010, 624(2): 350-359.

DOI：10.1016/j.nima.2010.05.032

• X-ray diffraction
• X-ray detectors
• Silicon strip detectors
• Spatial resolution
• Energy resolution
• Charge division
• Front end electronics
• Low noise electronics

We describe the successful technology transfer of High Energy Physics (HEP) silicon-strip detectors for tracking of minimum ionising particles (MIPS) to industrial X-ray diffraction instruments In our application the detector is used to measure 1-D intensity profiles of low-energy photons The challenges of such an application are low noise because of the relatively low energy of X-ray photons from 5 to 22 key and high count rate capability The technical implementation with a focus on custom designed front-end electronics and optimisation of strip geometry taking into account the charge division effects is shown and the achieved pe

• 出版日期2010-12-11