A dose-rate effect in single-particle electron microscopy

作者：Chen James Z; Sachse Carsten; Xu Chen; Mielke Thorsten; Spahn Christian M T; Grigorieff Nikolaus^*

来源：Journal of Structural Biology, 2008, 161(1): 92-100.

DOI：10.1016/j.jsb.2007.09.017

• single-particle electron cryo-microscopy
• beam-induced movement
• radiation damage
• dose-rate effect
• high-resolution EM

A low beam intensity, low electron dose imaging method has been developed for single-particle electron cryo-microscopy (cryo-EM). Experiments indicate that the new technique can reduce beam-induced specimen movement and secondary radiolytic effects, such as "bubbling". The improvement in image quality, especially for multiple-exposure data collection, will help single-particle cryo-EM to reach higher resolution.

• 出版日期2008-1
• 单位河北医科大学