An SET hardened dual-modular majority voter circuit for TMR system

作者：Liu, Xiaopeng^*; Han, Yan; Zhang, Bin

来源：IEICE Electronics Express, 2014, 11(4): 20131029.

DOI：10.1587/elex.11.20131029

• dual-modular majority voter (DMV)
• SET
• triple-modular redundancy (TMR)
• radiation hardening

A Triple-modular redundancy (TMR) system will have a failure if Single Event Transient (SET) faults affect the voter. In this paper, we propose a full SET-tolerance dual-modular majority voter (DMV) circuit for all internal nodes. The DMV consisting of two simplex-modular voters, two inverters, a C-element inverter and a weak keeper is implemented in CMOS 40 nm technology. A novel XOR gate and a multiplexer based voter is also presented and used as a simplex-modular voter so that the whole DMV can be implemented by 40 CMOS transistors. A novel C-element weak keeper is also proposed to reduce power consumption. Monte-Carlo simulation results show that power consumption of DMV only increases by 11.09% compared to that of a single traditional voter.

• 出版日期2014
• 单位浙江大学