Development of a matrix test board for capacitor reliability testing

作者：Virkki J^*; Koskenkorva A; Frisk L

来源：Microelectronics Reliability, 2010, 50(9-11): 1711-1714.

DOI：10.1016/j.microrel.2010.07.023

For statistically reliable results, a large number of components must be tested. This research sought to find an efficient method to test the reliability of a large number of components; consequently, an 8 x 8 matrix test board was developed. On this test board, a failed component causes a voltage change in two measuring channels, enabling exact failure monitoring of several components by a reduced number of test channels. Commercial ceramic capacitors from seven different vendors and a test with over-voltage and high temperature were used to evaluate the test structure. The large amount of test data could then be statistically analyzed. Results proved this board to be an efficient way to test a large number of components.

• 出版日期2010-11