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摘要
Tunability of ferroelectric complex oxides is achieved by applied bias voltage. Many applications require usage of relatively low voltage which is achievable by using a ferroelectric thin-film. Recently developed dielectric metamaterials were implemented in bulk and in thick films. Metamaterials are resonant structures. The frequency range of 0.1-1.5 THz is of special interest for such applications as non-destructive evaluation of materials and detection of chemical and biological hazards. This paper numerically investigates the possibility of a resonant effect in a thin-film ferroelectric metamaterial and the effects of increased dielectric constant and thickness on the thin-film's resonance frequency.
- 出版日期2014-10-3
