摘要
We give an overview over several all-optoelectronic measurement systems which we have developed for transmittive and reflective imaging in the terahertz (THZ) frequency range. The systems employ either pulsed or continuous-wave THz radiation. in both cases, they work on the basis of singlepixel scanning. Addressing the potential for imaging in the medical and dental field, and the application of THz radiation for industrial surface and interface characterization, we explore dark-field imaging where the imaging contrast originates from diffraction and scattering effects coming from topography or refractive-index variations.
- 出版日期2007-8