科研之友
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摘要
In the present study, the degradation of the Ag-epoxy conductive adhesive/Sn interface at 85A degrees C and 85% relative humidity was investigated through a variety of microstructural analyses. After the humidity test, the interfacial electrical resistance increased, and the interface was easily separated by external stress. Transmission electron microscopic (TEM) analyses indicated that two different Sn oxides, namely SnO and SnO2, were formed inhomogeneously at the interface in the humidity test. In addition, many voids were formed at the interface between Sn oxides and Sn plating. These Sn oxides and voids were the cause of the interfacial degradation.
- 出版日期2009-6
