Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection

作者：Jiao, Jiajia^*; Fu, Yuzhuo; Wen, Shijie

来源：Microelectronics Reliability, 2014, 54(11): 2629-2640.

DOI：10.1016/j.microrel.2014.06.008

• AVF assessment
• NoC
• Soft error
• MCU
• Acceleration
• Fault injection

With the increasing threat of soft errors induced bits upset, Network on Chip (NoC) as the communication infrastructure in many-core systems has been proven a reliability bottleneck in a fault tolerant parallel system. The often-used metric Architecture Vulnerability Factor (AVF), measures the architecture-level soft error impacts to compromise the design cost of fault tolerant schemes and reliability well. As a complementary of existing estimation methods about standard IP like processor and Cache, this work aims at an accelerated fault injection methodology for the fine-grain AVF assessment in NoC via two components: (1) modeling the complex fault patterns of both Multi-Cell Upsets (MCU) and Single Bit Upset (SBU) in the standard Fault Injection (FI) method; (2) accelerating the estimation via classifying and exploiting the fine-grain metrics according to different error impacts. The comprehensive simulation results using the diverse configures (e.g., varying fault model, benchmark, traffic load, network size and fault list size) also demonstrate that the proposed approach (i) shrinks the estimation inaccuracy due to MCU patterns 18.89% underestimation in no protection case and 88.92% overestimation under ECC (Error Correction Coding) protection on average; (ii) achieves about 5 x speedup without estimation accuracy loss via phased pre-analysis based on fine-grain classification; (iii) verifies ECC a cost-effective mechanism to protect NoC router: soft errors reduced by about 50% over the no protection case, with only less than 2% area overhead.

• 出版日期2014-11
• 单位Cisco; 上海交通大学