摘要

Recent experiments and atomic scale computations indicate that the standard continuum models of diffusion in stressed solids do not accurately describe transport, deformation and stress in Li-Si alloys. We suggest that this is because classical models do not account for the irreversible changes in atomic structure of Si that are known to occur during a charge discharge cycle. A more general model of diffusion in an amorphous solid is described, which permits unoccupied Si lattice sites to be created or destroyed. This may occur as a thermally activated process; or as a result of irreversible plastic deformation under stress. The model predicts a range of phenomena observed in experiment that cannot be captured using classical models, including irreversible changes in volume resulting from a charge discharge cycle, asymmetry between the tensile and compressive yield stress, and a slow evolution in mechanical and electrochemical response over many charge discharge cycles.

  • 出版日期2015-10-1