X-ray diffraction investigation of siloxanes. III. Structure and configuration of cyclic tetra-and pentasiloxanes bearing different organic substituents at silicon atoms

作者：Malinovskii S T^*; Vallina A Tesuro; Stoeckli Evans H

来源：Journal of Structural Chemistry, 2007, 48(1): 128-136.

DOI：10.1007/s10947-007-0019-7

• cyclic siloxanes
• organic substituents
• interatomic distances
• hydrogen bond

Single crystal X-ray diffraction is applied to elucidate the structures of six tetra-and one penta-siloxane compounds differing in the nature and position of silicon-sitting organic substituents (Me - methyl, Ph - phenyl, mPh - methoxyphenyl, 2mPh - dimethoxyphenyl, 3mPh - trimethoxypehnyl, and C4H6N - butironitrile). Charge states of atoms in the siloxane molecules are calculated, and the effect of oxygen-containing radicals on the Si-O bond lengths and Si-O-Si bond angles affecting the configurations of the tetra-and pentasiloxane cycles is shown.

• 出版日期2007-1