Tomography of a Probe Potential Using Atomic Sensors on Graphene

作者：Wyrick, Jonathan^*; Natterer, Fabian D.; Zhao, Yue; Watanabe, Kenji; Taniguchi, Takashi; Cullen, William G.; Zhitenev, Nikolai B.; Stroscio, Joseph A.^*

来源：ACS Nano, 2016, 10(12): 10698-10705.

DOI：10.1021/acsnano.6b05823

• STM
• graphene
• cobalt
• atomic manipulation
• defect charging
• probe potential
• tip-induced band bending
• screening

Our ability to access and explore the quantum world has been greatly advanced by the power of atomic manipulation and local spectroscopy with scanning tunneling and atomic force microscopes, where the key technique is the use of atomically sharp probe tips to interact with an underlying substrate. Here we employ atomic manipulation to modify and quantify the interaction between the probe and the system under study that can strongly affect any measurement in low charge density systems, such as graphene. We transfer Co atoms from a graphene surface onto a probe tip to change and control the probe's physical structure, enabling us to modify the induced potential at a graphene surface. We utilize single Co atoms on a graphene field-effect device as atomic scale sensors to quantitatively map the modified potential exerted by the scanning probe over the whole relevant spatial and energy range.

• 出版日期2016-12
• 单位南方科技大学