Multispectral Classification With Bias-Tunable Quantum Dots-in-a-Well Focal Plane Arrays

作者：Paskaleva Biliana S^*; Jang Woo Yong; Bender Steven C; Sharma Yagya D; Krishna Sanjay; Hayat Majeed M

来源：IEEE Sensors Journal, 2011, 11(6): 1342-1351.

DOI：10.1109/JSEN.2010.2095456

• Bias tunability
• dots-in-a-well (DWELL)
• infrared (IR) detector
• multispectral (MS) classification
• quantum-dots
• rock classification

Mid-wave and long-wave infrared (IR) quantum-dots-in-a-well (DWELL) focal plane arrays (FPAs) are promising technology for multispectral (MS) imaging and sensing. The DWELL structure design provides the detector with a unique property that allows the spectral response of the detector to be continuously, albeit coarsely, tuned with the applied bias. In this paper, a MS classification capability of the DWELL FPA is demonstrated. The approach is based upon: 1) imaging an object repeatedly using a sequence of bias voltages in the tuning range of the FPA and then 2) applying a classification algorithm to the totality of readouts, over multiple biases, at each pixel to identify the "class" of the material. The approach is validated for two classification problems: separation among different combinations of three IR filters and discrimination between rocks. This work is the first demonstration of the MS classification capability of the DWELL FPA.

• 出版日期2011-6