Applying multifractal formalism combined with wavelet transform to wood defects detection

作者：Ni, Hai Ming; Qi, Da Wei^*; Mu, Hongbo

来源：International Journal of Smart Home, 2016, 10(4): 119-128.

DOI：10.14257/ijsh.2016.10.4.12

• Internal defects
• Multi-fractal spectrum
• Multifractal formalism
• Multifractal theory
• Non destructive testing
• Wood cutting
• Wood defects
• X-ray computed tomography

Nowadays, X-ray computed tomography (CT) wood nondestructive testing technology has been applied to detection of internal defects in log for the purpose of obtaining the optimal wood cutting plan. Multifractal spectrum and wavelet transform are usually used for analyzing, modeling, and extracting different complex features of signals and images. A novel CT image edge detection method which using multifractal spectrum theory combined with wavelet transform is applied in this paper. The new method can be divided into the following main steps: (1) Calculating the wavelet module values of wood defect image. (2) Combining wavelet transform module values with multifractal theory. (3) Calculating the multifractal spectrum from the wavelet transform. (4) Selecting the appropriate threshold to wood defects detection. A large number of experimental results show that the new method to recognize the wood defects is effective.

• 出版日期2016
• 单位东北林业大学