Microfocus infrared ellipsometry characterization of air-exposed graphene flakes

作者:Weber J W*; Hinrichs K; Gensch M; van de Sanden M C M; Oates T W H
来源:Applied Physics Letters, 2011, 99(6): 061909.
DOI:10.1063/1.3624826

摘要

Graphene and ultrathin graphite flakes prepared by exfoliation were characterized by microfocus synchrotron infrared mapping ellipsometry. The dielectric function of graphene in a dry-air atmosphere is determined and compared to that of ultrathin graphite, bulk graphite, and gold. The imaginary part of graphene is revealed to be about an order of magnitude higher than that of graphite and comparable to that of gold. Comparing the conductivity to an optical model considering intraband transitions, we discuss the critical effects of environmental exposure, relevant for real-world applications.

  • 出版日期2011-8-8