Micro four-point probe investigation of individual ZnO grain boundaries in a varistor ceramic

作者：Nevosad A; Hofstaetter M; Supancic R; Danzer R; Teichert C^*

来源：Journal of the European Ceramic Society, 2014, 34(8): 1963-1970.

DOI：10.1016/j.jeurceramsoc.2014.01.027

• ZnO
• Varistors
• Micro four-point probe
• Semiconductor grain boundaries

The varistor effect in ZnO ceramics is triggered by the behavior of the grain boundaries. To understand this effect in detail we have electrically characterized individual grain boundaries. Here, we apply the micro four-point probe method to measure the electrical properties of individual grain boundaries in a polycrystalline ZnO varistor ceramic with a mean grain size of 10 mu m. The investigation revealed a wide spread in electrical properties, like nonlinearty exponents from 10 to 150 and switching voltages from 2.3 V to 3.6 V.

• 出版日期2014-8