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摘要
The authors have investigated spin dynamics properties and magnetic anisotropy parameters of epitaxial Co2FeAl0.5Si0.5 (CFAS) thin films using electrical detection of ferromagnetic resonance on basis of spin rectification effect. The samples of CFAS were grown on (001) MgO substrate by sputtering, and patterned into stripes with a length of 760 m and various widths between 5 and 40 mu m for the electric detection. Analysis of the angle dependent FMR allows the anisotropy field, K-1 to be determined (1.04 x 10(5) erg/cm3). By analyzing the line width vs the resonant frequency, a damping constant alpha, of 0.005 is obtained.
- 出版日期2012-8
