Use of a hexapod in diffraction measurements of substrate-supported crystals of organic semiconductors

作者：Yang Lin^*; Yang Hoichang

来源：Journal of Synchrotron Radiation, 2009, 16(6): 788-795.

DOI：10.1107/S0909049509037911

• X-ray diffraction
• hexapod
• transmission
• grazing incidence

Thin films of organic semiconductor prepared on substrates generally contain crystals that have one common crystal plane parallel to the substrate but random in-plane orientations. In diffraction measurements of these structures, it is often required to anchor the X-ray beam on a fixed spot on the sample, such as an optically visible crystallite or island. Here, a hexapod is used in place of a traditional multi-circle diffractometer to perform area-detector-based diffraction measurements on an actual device that contains 6,13-bis(triisopropylsilyethynyl)-pentacene (TIPS-pentacene) crystals. The hexapod allows for sample rotations about any user-defined rotation center. Two types of complex sample motions have been programmed to characterize the structure of the TIPS-pentacene crystal: an in-plane powder average has been performed at a fixed grazing-incident angle to determine the lattice parameters of the crystal; then the in-plane component of the scattering vector was continuously rotated in transmission geometry to determine the local crystal orientation.

• 出版日期2009-11