摘要

A new method of phase determination is presented to measure the frequency and intensity temporal profiles of attosecond XUV pulses directly, simultaneously and completely. Using a cross correlation between femtosecond laser and attosecond XUV, such profiles can be reconstructed from photoelectron energy spectra measured with two different laser intensities at 0 degrees and 180 degrees with respect to the linear laser polarization. The method has a temporal measurement range from a quarter to about half of laser oscillation period. The temporal resolution depends on the jitter and control precision of the laser and XUV pulses. The method can be used for ultra-fast measurement on attosecond time scale.